Argon Electronics has launched the LCD3.3-SIM / M4E1 JCAD-SIM, a new detector simulator that enhances the efficiency and safety of CBRN (Chemical, Biological, Radiological and Nuclear) response training by responding to electronic simulation sources that represent chemical vapours, toxic industrial substances or false positives. Training exercises using the LCD3.3-SIM / JCAD detector simulator can be set up swiftly and safely, with no need to use simulants that are harmful to the environment or the personnel involved.
Because they pose no risk to health, the electronic simulation sources can be set anywhere, including within public buildings, in less than ten minutes. Training efficiency is further enhanced by the capability to configure the menu structure of the LCD3.3-SIM / JCAD simulator to precisely match the menu structure and language options of your actual detector.
The LCD3.3-SIM is available in military and FR (First Responder) product versions and can be used to simulate a wide range of emergency conditions, including the presence of nerve, blister, blood, choking Agents, TICs and False Positives; contamination, decontamination and persistency; and the effects of wind direction and temperature.
Efficiency is enhanced by a simple remote control that allows the instructor total control of the exercise. The instructor can use the remote to determine the effectiveness of decontamination drills by controlling the remaining contamination, to simulate persistency and the effects of wind or temperature, and to instantly reset a scenario for the next exercise. LCD3.3-SIM / JCAD-SIM is compatible with other simulators designed by Argon Electronics, including AP2C-SIM, CAMSIM and CP100-SIM, permitting multi-detector, multi substance training to take place within the same training scenario.
LCD3.3-SIM (known as M4E1 JCAD-SIM in the USA) is designed to be fully compatible with Argon’s Plume SIM system, a state-of-the-art instrumented CBRN response training simulation system that has significantly enhanced flexibility and ease-of-use in field exercises.
Source: Argon Electronics
Date: Oct 24, 2012